|-- Test Center Showcase
C) "TEST FRAME"
FOR IrDA BIT-ERROR-RATE TEST: WHY DO WE NEED IT?
Most of the hardware components such as the IR
transceiver, the encoder/
decoder or the integrated IrDA I/O chip are often tested by the
manufacturer to be IrDA compliant. Each software layer of course can
be individually tested to be IrDA compliant. However, when all these
compliant components are put together, unexpected result may happen.
Once the engineering phase is done and manufacturing phase starts,
are many possibilities at the assembly line too. Also, after the
phase is done and the products are shipped, there remains the
service issue of screening test in the field or at service centers.
Methods for system testing must be planned and designed into the
implementation, not an afterthought. A good system test methodology
essential to facilitate both engineering, the production and field
Most of engineering mishaps usually are "in the area between
Layer and IrLAP". Production mishaps usually are "confined
Layer only". Consequently, a very simple and effective system
to access the optional test frame feature of IrLAP, particularly
test frame feature within a connection.
The test frame feature is very simple to implement in the device
test. This can usually be accomplished by "adding only 6 lines
codes! (attached here)". If implemented, a specially programmed
tool can fully exercise the Physical Layer and IrLAP layer in
device under test (DUT) automatically. This test can range from
thorough for engineering study or QC diagnosis to very speedy
production, quality control or field screening. Both fashions
especially useful for Inter-op test among different IrDA device
Anybody who can implement IrDA stack can write it in 10
For such little effort and no overhead, one can enable such
and convenient testing in the phases following the engineering
implementation. We therefore, recommend that the Test Frame in
IrLAP layer to be mandatory.